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 IR FPA sensors are the most important modules of thermal imagers. Design of sensor electronics (camera core) is a crucial part of designing of new thermal imager.  Knowledge   of  precise parameters of IR FPA sensor is needed by both professionals involved in both  IR FPA technology/thermal imagers technology because parameters of IR FPA sensors determine performance limits of thermal imagers. Therefore test equipment that enable measurement of IR FPA sensors is a vital tool for development of both  IR FPA technology/thermal imagers technology.

     It is commonly known that data sheets provided by manufacturers of IR FPA sensors (both cooled or non-cooled) provide too little details for electronics designers. Sometimes the provided data is not accurate enough and better sensor performance can be achieved using modified control signals. Therefore design teams loose sometimes years to develop electronic camera core optimized for a specific IR FPA sensor. When the type of the IR FPA sensor is changed the whole process is to be repeated.  In this situation an universal, flexible  camera core that would accept IR FPA sensors from different manufacturers and to carry out  semi-automatic determination of optimal signal controls for a specific IR FPA sensor would be highly desirable.   

Fig. 1. Photo of  FT test system  in configuration for measurement of image quality parameters  (FT-I configuration	Fig. 2. Photo of  two adapters to connect IR FPA sensors
Fig.3. Photo of  FT test system  in configuration for measurement of  noise/responsivity parameters (FT-N configuration )	Fig.4.  Photo of  FT test system  in configuration for measurement of spectral  parameters (FT-S configuration)

   FT test  system is a modular test system developed to enable two tasks. First,  to enable measurement of all important parameters (noise/sensitivity parameters, image quality parameters, spectral parameters) of IR FPA sensors. Second, to carry  out  semi-automatic determination of optimal signal controls for a specific IR FPA sensor would enable to achieve the highest performance of this sensor.

   The FT   test system  is a modular laboratory class test system.  Due to modular design FT  test system  can be easily and quickly configured in form of three  semi-independent test stations: the FT-N   station, the FT-I  station , the FT-S station  on any large laboratory optical table.

The task of these station s are following:

1. FT-N   station - measurement of noise and response characteristics  of IR FPAs (option: optimisation of IR FPA controls);

2.  FT-I  station - measurement of image resolution characteristics  of IR FPAs

3.  FT-S  station -  measurement of spectral characteristic of IR FPAs.

Data sheet: FT test system  

In order to learn more  please contact us.

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