Education

Education

There is numerous literature on  surveillance electro-optical systems (thermal imagers, night vision devices, VIS-NIR cameras, SWIR imagers, laser range finders, laser designators, multi-sensors systems, fused systems, UV cameras, optical sights) and main blocks of such systems (image intensifier tubes, IR FPA/CCD/CMOS imaging sensors, optical objectives).  However, it is difficult to master electro-optical metrology even at rudimentary level due to big size of EO technology, non-standardized terminology, unclear recommendations of a dozen of existing  standards, wide non-standardized areas, and myriads of test systems offered on market.

Next, it is surprising but testing surveillance EO systems is difficult even for experts in electro-optical metrology. In spite of significant progress in equipment for testing electro-optical surveillance systems over the last decade (modern test systems are increasingly computerized, employ advanced image processing and offer software support in measurement process) accuracy of measurements of parameters of EO systems is much lower comparing to accuracy of measurement of physical quantities listed in SI system of units. It is quite common that different test stations, when testing the same device, produce slightly different results. It can even happen that two testing teams, while working on the same test station, with the same tested device, produce different results. Rapid growth of electro-optical technology, poor standardization, limited metrology infrastructure, subjective nature of some measurements, fundamental limitations from laws of physics, tendering rules and advances in artificial intelligence are major factors responsible for such situation.

Inframet is manufacturer of equipment for testing electro-optical systems interested to sell its test system. However, we believe also in partner relations and cooperation with our customers, and that it is our duty to share our know-how in EO metrology. Next, customers having significant knowledge on EO metrology can use our test systems much more effectively than novices to this technology. Due to this combination of scientific openness with commercial reasons Inframet has decided to create educational section at its website where a series of books, scientific papers and other materials related to EO metrology can be found. We hope that this section can help its readers to better understand sophisticated world of testing surveillance electro-optical systems.